KLA-Tencor先进的探针式台阶仪

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inkMacSystemFont,"SFProSC","SFProText","HelveticaNeue",Helvetica,"PingFangSC","SegoeUI",Roboto,"HiraginoSansGB",arial,"microsoftyaheiui","MicrosoftYaHei",SimSun,sans-serif;font-size:16px;orphans:2;widows:2;background-color:transparent;">KLA-Tencor先进的探针式台阶仪，可精确测量纳米级至2毫米台阶高度，并可分析薄膜表面粗糙度、波纹度、应力，集高测量精度、多功能性和经济性于一体，是生产线及材料分析等应用领域的理想选择。因其具有6.0A(1σ)或0.1%台阶高度重复性以及亚埃级的分辨率,是目前商业化仪器里（经市场验证）特别高精度的台阶仪产品。

inkMacSystemFont,"SFProSC","SFProText","HelveticaNeue",Helvetica,"PingFangSC","SegoeUI",Roboto,"HiraginoSansGB",arial,"microsoftyaheiui","MicrosoftYaHei",SimSun,sans-serif;font-size:16px;orphans:2;widows:2;background-color:transparent;">