管理员
| 空间分辨率 | 0.02nm | 样品尺寸 | 100mm*100mm |
| 样品台移动范围 | 20mm*20mm |
详细介绍
Park XE7 Specifications
Guided high-force flexure scanner
Scan range : 25 µm
Height noise level : 50 pm
(RMS, at 0.5 kHz bandwidth)
Single module flexure XY-scanner with closed-loop control
Scan range : 50 µm × 50 µm
(optional 10 µm × 10 µm or 100 µm × 100 µm)
Z travel range : 29.5 mm (Motorized)
Focus travel range : 70 mm (Manual)
XY travel range : 13mm × 13 mm (Manual)
Sample size : Open space up to 100 mm x 100 mm, thickness up to 20 mm
Sample weight : < 500g
Coupled with 10x (0.28 N.A.) objective lens
Direct on-axis vision of sample surface and cantilever
Field-of-view : 480 × 360 µm (with 10× objective lens)
CCD : 1 M pixel, 5 M pixel (optional)
Dedicated system control and data acquisition software
Adjusting feedback parameters in real time
Script-level control through external programs (optional)
AFM data analysis software
High performance DSP : 600 MHz with 4800 MIPS
Maximum 16 data images
Maximum data size : 4096 × 4096 pixels
Signal inputs : 20 channels of 16 bit ADC at 500 kHz samplings
Signal outputs : 21 channels of 16 bit DAC at 500 kHz settling
Synchronous signal : End-of-image, end-of-line, and end-of-pixel TTL signals
Active Q control (optional)
Cantilever spring constant calibration (optional)
CE Compliant
Power : 120 W
Signal Access Module (Optional)
粤公网安备44196802000105号
400-6226-992